WIZpen is an advanced non-contact white light optical scanning probe based on patented technology for top precision measurement.

Nextec’s WIZpen is a key integrated component in many of Nextec’s top precision metrology inspection and surface finish measurement products.

WIZpen measurement accuracy is guaranteed over a wide range of material types, colors, surface finish types and beam angles due to advanced real time close loop adaptive control.

  • Based on an innovative optical principle which uses the chromatic coding of space
  • Ability to make measurements on nearly any kind of material, with exceptional accuracy.
  • Transparent Materials Inspection
  • Super Reflective Materials Inspection

The Confocal setup is an optical setup in which an optical system generates the image S’ of a point source S on the surface of the object. The backscattered light is collected by the same optical system, which images the light spot on a pinhole S”. The pinhole is placed in front of a photodetector. It filters the light rays that can reach the photodetector and for this reason it is also called “spatial filter”.

Confocal setups are characterized by an exceptional Signal-to-Noise ratio. In the case of CCI the optical system is the chromatic optical pen and the photodetector is a spectrometer. Chromatic coding of the optical axis means that the optical system has axial chromatism: each wavelength is focalized at a different point along this axis.

Suppose now that a sample is present inside the chromatically-coded range so that the wavelength is focalized on its surface. When the reflected (or backscattered) beam reaches the plane of the pinhole, the rays at wavelength are focalized on the pinhole so they can pass through the pinhole and reach the sensitive area of the spectrometer. Other wavelengths are imaged as large spots so they are blocked by the pinhole. The spectrometer “decodes” the sample position by identifying the wavelength. The spectrometer signal corresponds to the spectral repartition of the collected light. It presents a spectral peak. The spectral peak on the spectrometer shifts as the object moves inside the measuring range.

Key Benefits

The WIZpen is small in size and has a standard CMM PH10M indexing head interface.

  • Quick measurement of top precision parts
  • Real time adaptive control
  • Ability to measure very small geometry features
  • Ability to scan very shiny surfaces
  • Ability to measure soft or warm material
  • Ability to measure glass and all other fully transparent materials
  • Ability to measure glass thickness from one side – no need to flip the part
  • Ability to measure soft materials
  • Ability to measure coating thickness
  • Fast measurements – dramatically reduces measuring time
  • High and adjustable data collection scanning resolution
  • No moving parts and no wear – ultimate life cycle and high
  • reliability
  • Maintenance free
  • Wide dynamic range
  • PH-10 indexing head compatibility
  • Transparent materials
  • Super reflective materials

Performance Specifications WIZpen 32-12B

Scanning rate: 100-2000 points per second
Stand-off distance :(1) 32 mm
Dynamic range: ±6 mm
Maximum permissible probe error (2) (MPEp): 5 µm
Maximum permissible beam angle for inspection:(3) 42˚
Spot diameter: 17 µm
Probe weight: 325 g

WIZpen 18-4B

Scanning rate: 100-2000 points per second
Stand-off distance :(1) 18.2 mm
Dynamic range: ±2 mm
Maximum permissible probe error (2) (MPEp): 4 µm
Maximum permissible beam angle for inspection:(3) 50˚
Spot diameter: 7 µm
Probe weight: 325 g

WIZpen 11-04B

Scanning rate: 100-2000 points per second
Stand-off distance :(1) 11 mm
Dynamic range: ±200 µm
Maximum permissible probe error (2) (MPEp): 0.05 µm
Maximum permissible beam angle for inspection of a flat surface (3) : 60˚
Spot diameter: 4 µm
Probe weight: 385 g

(1) Stand-off distance is defined as object-to-probe lens distance
(2) MPEp value is the maximum probe uncertainty value
(3) Maximum permissible beam angle, is the maximum angle of scanning for valid measurements